IEEE - Institute of Electrical and Electronics Engineers, Inc. - A Statistic-Based Approach to Testability Analysis

2008 9th International Symposium on Quality Electronic Design (ISQED '08)

Author(s): Chuang-Chi Chiou ; Chun-Yao Wang ; Yung-Chih Chen
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 March 2008
Conference Location: San Jose, CA, USA
Conference Date: 17 March 2008
Page(s): 267 - 270
ISBN (Paper): 978-0-7695-3117-5
DOI: 10.1109/ISQED.2008.4479737
Regular:

This paper presents a statistic-based approach for evaluating the testability of nodes in combinational circuits. This testability measurement is obtained via Monte Carlo simulation governed by... View More

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