IEEE - Institute of Electrical and Electronics Engineers, Inc. - Dominant Substrate Noise Coupling Mechanism for Multiple Switching Gates

2008 9th International Symposium on Quality Electronic Design (ISQED '08)

Author(s): E. Salman ; E.G. Friedman ; R.M. Secareanu ; O.L. Hartin
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 March 2008
Conference Location: San Jose, CA, USA
Conference Date: 17 March 2008
Page(s): 261 - 266
ISBN (Paper): 978-0-7695-3117-5
DOI: 10.1109/ISQED.2008.4479736
Regular:

The dominant substrate noise coupling mechanism is determined for multiple switching gates based on a physically intuitive model. The model exhibits reasonable accuracy as compared to SPICE. The... View More

Advertisement