IEEE - Institute of Electrical and Electronics Engineers, Inc. - Timing-Aware Multiple-Delay-Fault Diagnosis

2008 9th International Symposium on Quality Electronic Design (ISQED '08)

Author(s): V.J. Mehta ; M. Marek-Sadowska ; Kun-Han Tsai ; J. Rajski
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 March 2008
Conference Location: San Jose, CA, USA
Conference Date: 17 March 2008
Page(s): 246 - 253
ISBN (Paper): 978-0-7695-3117-5
DOI: 10.1109/ISQED.2008.4479734
Regular:

With feature sizes steadily shrinking, manufacturing defects and parameter variations often cause design timing failures. It is essential that these errors be correctly and quickly diagnosed. In... View More

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