IEEE - Institute of Electrical and Electronics Engineers, Inc. - An On-Demand Test Triggering Mechanism for NoC-Based Safety-Critical Systems

2008 9th International Symposium on Quality Electronic Design (ISQED '08)

Author(s): J.D. Lee ; N. Gupta ; P.S. Bhojwani ; R.N. Mahapatra
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 March 2008
Conference Location: San Jose, CA, USA
Conference Date: 17 March 2008
Page(s): 184 - 189
ISBN (Paper): 978-0-7695-3117-5
DOI: 10.1109/ISQED.2008.4479723
Regular:

As embedded and safety-critical applications begin to employ many-core SoCs using sophisticated on-chip networks, ensuring system quality and reliability becomes increasingly complex.... View More

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