IEEE - Institute of Electrical and Electronics Engineers, Inc. - Robust Estimation of Timing Yield with Partial Statistical Information on Process Variations

2008 9th International Symposium on Quality Electronic Design (ISQED '08)

Author(s): Lin Xie ; A. Davoodi
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 March 2008
Conference Location: San Jose, CA, USA
Conference Date: 17 March 2008
Page(s): 156 - 161
ISBN (Paper): 978-0-7695-3117-5
DOI: 10.1109/ISQED.2008.4479718
Regular:

This paper illustrates the application of distributional robustness theory to compute the worst-case timing yield of a circuit. Our assumption is that the probability distribution of process... View More

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