IEEE - Institute of Electrical and Electronics Engineers, Inc. - Minimizing Offset for Latching Voltage-Mode Sense Amplifiers for Sub-Threshold Operation

2008 9th International Symposium on Quality Electronic Design (ISQED '08)

Author(s): J.F. Ryan ; B.H. Calhoun
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 March 2008
Conference Location: San Jose, CA, USA
Conference Date: 17 March 2008
Page(s): 127 - 132
ISBN (Paper): 978-0-7695-3117-5
DOI: 10.1109/ISQED.2008.4479712
Regular:

This paper examines latch style voltage mode sense amplifiers for operation in the sub-threshold region, where VDDT. We show that the offset gets worse relative to strong inversion as... View More

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