IEEE - Institute of Electrical and Electronics Engineers, Inc. - Tutorial 6: Enhancing Yield through Design for Manufacturability (DFM)

2008 9th International Symposium on Quality Electronic Design (ISQED '08)

Author(s): Praveen Elakkumanan
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 March 2008
Conference Location: San Jose, CA, USA
Conference Date: 17 March 2008
Page(s): 8 - 9
ISBN (Paper): 978-0-7695-3117-5
ISSN (Electronic): 1948-3295
ISSN (Paper): 1948-3287
DOI: 10.1109/ISQED.2008.4479689
Regular:

Summary form only given. This part of the tutorial will discuss in detail the manufacturing challenges in nanoscale VLSI and consequent design for manufacturability (DFM) approaches by taking a... View More

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