IEEE - Institute of Electrical and Electronics Engineers, Inc. - Effect of vacancy defects on the fundamental frequency of carbon nanotubes

3rd IEEE International Conference on Nano/Micro Engineered and Molecular Systems

Author(s): M. Pirmoradian ; M.T. Ahmadian ; A. Asempour ; S.A. Tajalli
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2008
Conference Location: Sanya, China
Conference Date: 6 January 2008
Page(s): 1,000 - 1,004
ISBN (CD): 978-1-4244-1908-1
ISBN (Paper): 978-1-4244-1907-4
DOI: 10.1109/NEMS.2008.4484490
Regular:

Carbon nanotubes are widely used in the design of nanosensors and actuators. Any defect in the manufactured nanotube plays an important role in the natural frequencies of these structures. In this... View More

Advertisement