IEEE - Institute of Electrical and Electronics Engineers, Inc. - Feedback control implementation for AFM contact-mode scanner

3rd IEEE International Conference on Nano/Micro Engineered and Molecular Systems

Author(s): Wenlin Zhang ; Lei Miao ; Yunhui Zheng ; Zaili Dong ; Ning Xi
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2008
Conference Location: Sanya, China
Conference Date: 6 January 2008
Page(s): 617 - 621
ISBN (CD): 978-1-4244-1908-1
ISBN (Paper): 978-1-4244-1907-4
DOI: 10.1109/NEMS.2008.4484408
Regular:

The atomic force microscope (AFM) has become a standard technique to measure the topography properties of sample surfaces with nanometer resolution. And the AFM tip based Nano manipulation system... View More

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