IEEE - Institute of Electrical and Electronics Engineers, Inc. - Design and simulation of logic circuits by combined single-electron/MOS Transistor Structures

3rd IEEE International Conference on Nano/Micro Engineered and Molecular Systems

Author(s): Qin Li ; Li Cai ; Youjie Zhou ; Gang Wu ; Sen Wang
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2008
Conference Location: Sanya, China
Conference Date: 6 January 2008
Page(s): 210 - 214
ISBN (CD): 978-1-4244-1908-1
ISBN (Paper): 978-1-4244-1907-4
DOI: 10.1109/NEMS.2008.4484320
Regular:

Based on both the I-V characteristics of single-electron transistors and the MOS digital integrated circuit design concept, a good combination of single-electron transistors with MOS transistors... View More

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