IEEE - Institute of Electrical and Electronics Engineers, Inc. - Robustness evaluation of ESD protection devices in NEMS using a novel TCAD methodology

3rd IEEE International Conference on Nano/Micro Engineered and Molecular Systems

Author(s): Qiang Cui ; Shurong Dong ; J.J. Liou ; Yan Han
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2008
Conference Location: Sanya, China
Conference Date: 6 January 2008
Page(s): 41 - 44
ISBN (CD): 978-1-4244-1908-1
ISBN (Paper): 978-1-4244-1907-4
DOI: 10.1109/NEMS.2008.4484282
Regular:

Robustness performance is one of the most important concerns in the design of ESD (electro-static discharge) protection devices, and this quality plays a more and more important role in NEMS... View More

Advertisement