IEEE - Institute of Electrical and Electronics Engineers, Inc. - A compact microstructure mechanical property measuring system

3rd IEEE International Conference on Nano/Micro Engineered and Molecular Systems

Author(s): Tao Chen ; Lin Zhang ; Jian Wu ; Shibing Liu ; Tiechuan Zuo
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2008
Conference Location: Sanya, China
Conference Date: 6 January 2008
Page(s): 5 - 8
ISBN (CD): 978-1-4244-1908-1
ISBN (Paper): 978-1-4244-1907-4
DOI: 10.1109/NEMS.2008.4484275
Regular:

In this paper, we introduce a compact measuring system, to analyze microstructure force property. The system is specially designed in which a mechanical test machine, a PCB board based on an USB... View More

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