IEEE - Institute of Electrical and Electronics Engineers, Inc. - Determining Thermal Simulation Data from Transient Measurements

SEMI-THERM '08. 2008 24th Annual IEEE Semiconductor Thermal Measurement and Management Symposium

Author(s): M. Janicki ; S. Kindermann ; P. Pietrzak ; B. Vermeersch ; J. Banaszczyk ; G. De Mey ; A. Napieralski
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 March 2008
Conference Location: San Jose, CA, USA
Conference Date: 16 March 2008
Page(s): 198 - 201
ISBN (CD): 978-1-4244-2124-4
ISBN (Paper): 978-1-4244-2123-7
ISSN (Paper): 1065-2221
DOI: 10.1109/STHERM.2008.4509390
Regular:

This paper illustrates how the information obtained from dynamic thermal measurements can be used directly for the determination of certain unknown thermal data necessary for simulation purposes.... View More

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