IEEE - Institute of Electrical and Electronics Engineers, Inc. - Face Recognition Using 3D Head Scan Data Based on Procrustes Distance

2008 12th International Conference on Intelligent Engineering Systems (INES '08)

Author(s): A. Mostayed ; Sikyung Kim ; M.M. Gani Mazumder ; Se Jin Park
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 February 2008
Conference Location: Miami, FL, USA
Conference Date: 25 February 2008
Page(s): 203 - 208
ISBN (CD): 978-1-4244-2083-4
ISBN (Paper): 978-1-4244-2082-7
DOI: 10.1109/INES.2008.4481295
Regular:

Recently face recognition has attracted significant attention from the researchers and scientists in various fields of research, such as biomedical informatics, pattern recognition, vision, etc... View More

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