IEEE - Institute of Electrical and Electronics Engineers, Inc. - Pattern Matching of Partially Ordered Events in Information Management Systems

2008 12th International Conference on Intelligent Engineering Systems (INES '08)

Author(s): L. Vokorokos ; R. Vokorokosova
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 February 2008
Conference Location: Miami, FL, USA
Conference Date: 25 February 2008
Page(s): 169 - 172
ISBN (CD): 978-1-4244-2083-4
ISBN (Paper): 978-1-4244-2082-7
DOI: 10.1109/INES.2008.4481289
Regular:

The paper presents designed architecture of the intrusion management system based on events planning and intrusion pattern. The article describes problematic of a system management of computer... View More

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