IEEE - Institute of Electrical and Electronics Engineers, Inc. - Design of a Calibration System for Measuring Probes

2008 12th International Conference on Intelligent Engineering Systems (INES '08)

Author(s): G. Hermann
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 February 2008
Conference Location: Miami, FL, USA
Conference Date: 25 February 2008
Page(s): 59 - 62
ISBN (CD): 978-1-4244-2083-4
ISBN (Paper): 978-1-4244-2082-7
ISSN (Paper): 1543-9259
DOI: 10.1109/INES.2008.4481270
Regular:

The probe is a major component of CMM. New high precision designs are available. In the corresponding literature little information can be found about the 3D calibration of these probes. The paper... View More

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