IEEE - Institute of Electrical and Electronics Engineers, Inc. - Maximising Data Return: Towards a quality control strategy for Managing and Processing TRDI ADCP Data Sets from Moored Instrumentation

IEEE/OES 9th Working Conference on Current Measurement Technology, CMTC 2008

Author(s): J.A. Taylor ; A.M. Jonas
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 March 2008
Conference Location: Charlston, SC, USA
Conference Date: 17 March 2008
Page(s): 80 - 88
ISBN (CD): 978-1-4244-1486-4
ISBN (Paper): 978-1-4244-1485-7
DOI: 10.1109/CCM.2008.4480848
Regular:

In this paper, we evaluate, by means of case studies, methods for quality controlling data obtained from Teledyne RDI ADCP measurements (ensembles and bins or depth cells) such that the data can... View More

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