IEEE - Institute of Electrical and Electronics Engineers, Inc. - N-Model Tests for VLSI Circuits

40th Southeastern Symposium on System Theory

Author(s): N. Yogi ; V.D. Agrawal
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 March 2008
Conference Location: New Orleans, LA, USA
Conference Date: 16 March 2008
Page(s): 242 - 246
ISBN (CD): 978-1-4244-1807-7
ISBN (Paper): 978-1-4244-1806-0
ISSN (Paper): 0094-2898
DOI: 10.1109/SSST.2008.4480230
Regular:

We define N-model tests that target detection of faults belonging to N specified fault models. We provide a method for deriving minimal tests using integer linear programming (ILP) without... View More

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