IEEE - Institute of Electrical and Electronics Engineers, Inc. - Built-in Current Sensor for High Speed Transient Current Testing in Analog CMOS Circuits

40th Southeastern Symposium on System Theory

Author(s): S. Yellampalli ; N.S. Korivi ; J. Marulanda
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 March 2008
Conference Location: New Orleans, LA, USA
Conference Date: 16 March 2008
Page(s): 230 - 234
ISBN (CD): 978-1-4244-1807-7
ISBN (Paper): 978-1-4244-1806-0
ISSN (Paper): 0094-2898
DOI: 10.1109/SSST.2008.4480227
Regular:

In this paper, we present a new built-in current sensor (BICS) for high speed, low voltage degradation transient current (IDDT) testing. This sensor has been designed using forward bias... View More

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