IEEE - Institute of Electrical and Electronics Engineers, Inc. - Algorithms For Fault Location And Line Parameter Estimation Utilizing Voltage and Current Data During the Fault

40th Southeastern Symposium on System Theory

Author(s): Yuan Liao
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 March 2008
Conference Location: New Orleans, LA, USA
Conference Date: 16 March 2008
Page(s): 183 - 187
ISBN (CD): 978-1-4244-1807-7
ISBN (Paper): 978-1-4244-1806-0
ISSN (Paper): 0094-2898
DOI: 10.1109/SSST.2008.4480216
Regular:

This paper puts forward a new fault location and line parameter estimation algorithm by utilizing only the voltage and current measurements during the fault. The algorithm is applicable to... View More

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