IEEE - Institute of Electrical and Electronics Engineers, Inc. - An Improved Characterization for Predicting a Capability index with Dependence on Manufacturing Target Bias

40th Southeastern Symposium on System Theory

Author(s): R.J. Pieper ; N.T. Satyala
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 March 2008
Conference Location: New Orleans, LA, USA
Conference Date: 16 March 2008
Page(s): 113 - 117
ISBN (CD): 978-1-4244-1807-7
ISBN (Paper): 978-1-4244-1806-0
ISSN (Paper): 0094-2898
DOI: 10.1109/SSST.2008.4480201
Regular:

A target bias dependent capability index predictor is proposed and compared to two other commonly used paradigms. The formalism for the proposed approach assumes a normal (Gaussian) distribution... View More

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