IEEE - Institute of Electrical and Electronics Engineers, Inc. - Deep Submicron Interconnect Timing Model with Quadratic Random Variable Analysis

Design, Automation & Test in Europe. DATE'08

Author(s): Jun-Kuei Zeng ; Chung-Ping Chen
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 March 2008
Conference Location: Munich, Germany
Conference Date: 10 March 2008
Page(s): 1,091 - 1,094
ISBN (CD): 978-3-9810801-4-8
ISBN (Paper): 978-3-9810801-3-1
DOI: 10.1109/DATE.2008.4484922
Regular:

Shrinking feature sizes and process variations are of increasing concern in modern technology. It is urgent that we develop statistical interconnect timing models which are harmonious with the... View More

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