IEEE - Institute of Electrical and Electronics Engineers, Inc. - Re-Examining the Use of Network-on-Chip as Test Access Mechanism

Design, Automation & Test in Europe. DATE'08

Author(s): Feng Yuan ; Lin Huang ; Qiang Xu
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 March 2008
Conference Location: Munich, Germany
Conference Date: 10 March 2008
Page(s): 808 - 811
ISBN (CD): 978-3-9810801-4-8
ISBN (Paper): 978-3-9810801-3-1
DOI: 10.1109/DATE.2008.4484917
Regular:

Existing work on testing NoC-based systems advocates to reuse the on-chip network itself as test access mechanism (TAM) to transport test data to/from embedded cores. While this methodology... View More

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