IEEE - Institute of Electrical and Electronics Engineers, Inc. - Analysis and Optimization of the Recessed Probe Launch for High Frequency Measurements of PCB Interconnects

Design, Automation & Test in Europe. DATE'08

Author(s): R. Rimolo-Donadio ; C. Schuster ; Xiaoxiong Gu ; Y.H. Kwark ; M.B. Ritter
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 March 2008
Conference Location: Munich, Germany
Conference Date: 10 March 2008
Page(s): 252 - 255
ISBN (CD): 978-3-9810801-4-8
ISBN (Paper): 978-3-9810801-3-1
DOI: 10.1109/DATE.2008.4484891
Regular:

Measurements of internal printed circuit board (PCB) structures such as striplines and vias face the problem of launching clean test signals into the device under test (DUT). Traditionally,... View More

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