IEEE - Institute of Electrical and Electronics Engineers, Inc. - A Design-for-Diagnosis Technique for SRAM Write Drivers

Design, Automation & Test in Europe. DATE'08

Author(s): A. Ney ; P. Girard ; S. Pravossoudovitch ; A. Virazel ; M. Bastian ; V. Gouin
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 March 2008
Conference Location: Munich, Germany
Conference Date: 10 March 2008
Page(s): 1,480 - 1,485
ISBN (CD): 978-3-9810801-4-8
ISBN (Paper): 978-3-9810801-3-1
DOI: 10.1109/DATE.2008.4484883
Regular:

Diagnosis is becoming a major concern with the rapid development of semiconductor memories. It provides information about the location of manufacturing defects in the memory, and its effectiveness... View More

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