IEEE - Institute of Electrical and Electronics Engineers, Inc. - Automated Trace Signals Identification and State Restoration for Improving Observability in Post-Silicon Validation

Design, Automation & Test in Europe. DATE'08

Author(s): Ho Fai Ko ; N. Nicolici
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 March 2008
Conference Location: Munich, Germany
Conference Date: 10 March 2008
Page(s): 1,298 - 1,303
ISBN (CD): 978-3-9810801-4-8
ISBN (Paper): 978-3-9810801-3-1
DOI: 10.1109/DATE.2008.4484858
Regular:

Embedded logic analysis has emerged as a powerful technique for identifying functional bugs during post-silicon validation, as it enables at-speed acquisition of data from the circuit nodes in... View More

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