IEEE - Institute of Electrical and Electronics Engineers, Inc. - iFill: An Impact-Oriented X-Filling Method for Shift- and Capture-Power Reduction in At-Speed Scan-Based Testing

Design, Automation & Test in Europe. DATE'08

Author(s): Jia Li ; Qiang Xu ; Yu Hu ; Xiaowei Li
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 March 2008
Conference Location: Munich, Germany
Conference Date: 10 March 2008
Page(s): 1,184 - 1,189
ISBN (CD): 978-3-9810801-4-8
ISBN (Paper): 978-3-9810801-3-1
DOI: 10.1109/DATE.2008.4484839
Regular:

In scan-based tests, power consumptions in both shift and capture phases may be significantly higher than that in normal mode, which threatens circuits' reliability during manufacturing test. In... View More

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