IEEE - Institute of Electrical and Electronics Engineers, Inc. - Multi-Vector Tests: A Path to Perfect Error-Rate Testing

Design, Automation & Test in Europe. DATE'08

Author(s): S. Shahidi ; S. Gupta
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 March 2008
Conference Location: Munich, Germany
Conference Date: 10 March 2008
Page(s): 1,178 - 1,183
ISBN (CD): 978-3-9810801-4-8
ISBN (Paper): 978-3-9810801-3-1
DOI: 10.1109/DATE.2008.4484838
Regular:

The importance of testing approaches that exploit error tolerance to improve yield has previously been established. Error rate, defined as the percentage of vectors for which the value at a... View More

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