IEEE - Institute of Electrical and Electronics Engineers, Inc. - Incremental Criticality and Yield Gradients

Design, Automation & Test in Europe. DATE'08

Author(s): Jinjun Xiong ; V. Zolotov ; C. Visweswariah
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 March 2008
Conference Location: Munich, Germany
Conference Date: 10 March 2008
Page(s): 1,130 - 1,135
ISBN (CD): 978-3-9810801-4-8
ISBN (Paper): 978-3-9810801-3-1
DOI: 10.1109/DATE.2008.4484830
Regular:

Criticality and yield gradients are two crucial diagnostic metrics obtained from statistical static timing analysis (SSTA). They provide valuable information to guide timing optimization and... View More

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