IEEE - Institute of Electrical and Electronics Engineers, Inc. - Memory-aware NoC Exploration and Design

Design, Automation & Test in Europe. DATE'08

Author(s): N. Dutt
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 March 2008
Conference Location: Munich, Germany
Conference Date: 10 March 2008
Page(s): 1,128 - 1,129
ISBN (CD): 978-3-9810801-4-8
ISBN (Paper): 978-3-9810801-3-1
DOI: 10.1109/DATE.2008.4484829
Regular:

In the past decade, tremendous progress has been made in NoC research, spanning architectures, protocols and tools. In addition to a large number of academic and research projects, we are now... View More

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