IEEE - Institute of Electrical and Electronics Engineers, Inc. - Memory Technology for Extended Large-Scale Integration in Future Electronics Applications

Design, Automation & Test in Europe. DATE'08

Author(s): D. Pamunuwa
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 March 2008
Conference Location: Munich, Germany
Conference Date: 10 March 2008
Page(s): 1,126 - 1,127
ISBN (CD): 978-3-9810801-4-8
ISBN (Paper): 978-3-9810801-3-1
DOI: 10.1109/DATE.2008.4484828
Regular:

Extending 2-D planar topologies in integrated circuits (ICs) to a 3-D implementation has the obvious benefits of reducing the overall footprint and average interconnection length, with associated... View More

Advertisement