IEEE - Institute of Electrical and Electronics Engineers, Inc. - Design Guidelines for Metallic-Carbon-Nanotube-Tolerant Digital Logic Circuits

Design, Automation & Test in Europe. DATE'08

Author(s): Jie Zhang ; N.P. Patil ; S. Mitra
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 March 2008
Conference Location: Munich, Germany
Conference Date: 10 March 2008
Page(s): 1,009 - 1,014
ISBN (CD): 978-3-9810801-4-8
ISBN (Paper): 978-3-9810801-3-1
DOI: 10.1109/DATE.2008.4484813
Regular:

Metallic carbon nanotubes (CNTs) create source-drain shorts in carbon nanotube field effect transistors (CNFETs), causing excessive leakage, degraded noise margin and delay variation. There is no... View More

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