IEEE - Institute of Electrical and Electronics Engineers, Inc. - Globally Optimized Robust Systems to Overcome Scaled CMOS Reliability Challenges

Design, Automation & Test in Europe. DATE'08

Author(s): S. Mitra
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 March 2008
Conference Location: Munich, Germany
Conference Date: 10 March 2008
Page(s): 941 - 946
ISBN (CD): 978-3-9810801-4-8
ISBN (Paper): 978-3-9810801-3-1
DOI: 10.1109/DATE.2008.4484801
Regular:

Future system design methodologies must accept the fact that the underlying hardware will be imperfect, and enable design of robust systems that are resilient to hardware imperfections. Three... View More

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