IEEE - Institute of Electrical and Electronics Engineers, Inc. - Implications of Technology Trends on System Dependability

Design, Automation & Test in Europe. DATE'08

Author(s): J.A. Abraham
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 March 2008
Conference Location: Munich, Germany
Conference Date: 10 March 2008
Page(s): 940
ISBN (CD): 978-3-9810801-4-8
ISBN (Paper): 978-3-9810801-3-1
DOI: 10.1109/DATE.2008.4484800
Regular:

CMOS has been the dominant integrated circuit (IC) technology for nearly four decades, following the trends predicted by Moore's Law, and fueling the information and communication revolution. As... View More

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