IEEE - Institute of Electrical and Electronics Engineers, Inc. - Implications of Technology Trends on System Dependability
Design, Automation & Test in Europe. DATE'08
Author(s): | J.A. Abraham |
Publisher: | IEEE - Institute of Electrical and Electronics Engineers, Inc. |
Publication Date: | 1 March 2008 |
Conference Location: | Munich, Germany |
Conference Date: | 10 March 2008 |
Page(s): | 940 |
ISBN (CD): | 978-3-9810801-4-8 |
ISBN (Paper): | 978-3-9810801-3-1 |
DOI: | 10.1109/DATE.2008.4484800 |
Regular:
CMOS has been the dominant integrated circuit (IC) technology for nearly four decades, following the trends predicted by Moore's Law, and fueling the information and communication revolution. As... View More