IEEE - Institute of Electrical and Electronics Engineers, Inc. - CASP: Concurrent Autonomous Chip Self-Test Using Stored Test Patterns

Design, Automation & Test in Europe. DATE'08

Author(s): Yanjing Li ; S. Makar ; S. Mitra
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 March 2008
Conference Location: Munich, Germany
Conference Date: 10 March 2008
Page(s): 885 - 890
ISBN (CD): 978-3-9810801-4-8
ISBN (Paper): 978-3-9810801-3-1
DOI: 10.1109/DATE.2008.4484786
Regular:

CASP, concurrent autonomous chip self-test using stored test patterns, is a special kind of self-test where a system tests itself concurrently during normal operation without any downtime visible... View More

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