IEEE - Institute of Electrical and Electronics Engineers, Inc. - Test Strategies for Low Power Devices

Design, Automation & Test in Europe. DATE'08

Author(s): C.P. Ravikumar ; M. Hirech ; X. Wen
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 March 2008
Conference Location: Munich, Germany
Conference Date: 10 March 2008
Page(s): 728 - 733
ISBN (CD): 978-3-9810801-4-8
ISBN (Paper): 978-3-9810801-3-1
DOI: 10.1109/DATE.2008.4484765
Regular:

Ultra low-power devices are being developed for embedded applications in bio-medical electronics, wireless sensor networks, environment monitoring and protection, etc. The testing of these... View More

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