IEEE - Institute of Electrical and Electronics Engineers, Inc. - Random Stimulus Generation using Entropy and XOR Constraints

Design, Automation & Test in Europe. DATE'08

Author(s): S.M. Plaza ; I.L. Markov ; V. Bertacco
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 March 2008
Conference Location: Munich, Germany
Conference Date: 10 March 2008
Page(s): 664 - 669
ISBN (CD): 978-3-9810801-4-8
ISBN (Paper): 978-3-9810801-3-1
DOI: 10.1109/DATE.2008.4484754
Regular:

Despite the growing research effort in formal verification, constraint-based random simulation remains an integral part of design validation, especially for large design components where formal... View More

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