IEEE - Institute of Electrical and Electronics Engineers, Inc. - Physically-Aware N-Detect Test Pattern Selection

Design, Automation & Test in Europe. DATE'08

Author(s): Yen-Tzu Lin ; O. Poku ; N.K. Bhatti ; R.D. Blanton
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 March 2008
Conference Location: Munich, Germany
Conference Date: 10 March 2008
Page(s): 634 - 639
ISBN (CD): 978-3-9810801-4-8
ISBN (Paper): 978-3-9810801-3-1
DOI: 10.1109/DATE.2008.4484748
Regular:

N-detect test has been shown to have a higher likelihood for detecting defects. However, traditional definitions of N-detect test do not necessarily exploit the localized characteristics of... View More

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