IEEE - Institute of Electrical and Electronics Engineers, Inc. - State Skip LFSRs: Bridging the Gap between Test Data Compression and Test Set Embedding for IP Cores

Design, Automation & Test in Europe. DATE'08

Author(s): V. Tenentes ; X. Kavousianos ; E. Kalligeros
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 March 2008
Conference Location: Munich, Germany
Conference Date: 10 March 2008
Page(s): 474 - 479
ISBN (CD): 978-3-9810801-4-8
ISBN (Paper): 978-3-9810801-3-1
DOI: 10.1109/DATE.2008.4484726
Regular:

We present a new type of linear feedback shift registers, state skip LFSRs. state skip LFSRs are normal LFSRs with the addition of a small linear circuit, the State Skip circuit, which can be... View More

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