IEEE - Institute of Electrical and Electronics Engineers, Inc. - Low Power Illinois Scan Architecture for Simultaneous Power and Test Data Volume Reduction

Design, Automation & Test in Europe. DATE'08

Author(s): A. Chandra ; F. Ng ; R. Kapur
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 March 2008
Conference Location: Munich, Germany
Conference Date: 10 March 2008
Page(s): 462 - 467
ISBN (CD): 978-3-9810801-4-8
ISBN (Paper): 978-3-9810801-3-1
DOI: 10.1109/DATE.2008.4484724
Regular:

We present low power illinois scan architecture (LPILS) to achieve power dissipation and test data volume reduction, simultaneously. By using the proposed scan architecture, dynamic power... View More

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