IEEE - Institute of Electrical and Electronics Engineers, Inc. - A Case Study in Reliability-Aware Design: A Resilient LDPC Code Decoder

Design, Automation & Test in Europe. DATE'08

Author(s): M. May ; M. Alles ; N. Wehn
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 March 2008
Conference Location: Munich, Germany
Conference Date: 10 March 2008
Page(s): 456 - 461
ISBN (CD): 978-3-9810801-4-8
ISBN (Paper): 978-3-9810801-3-1
DOI: 10.1109/DATE.2008.4484723
Regular:

Chip reliability becomes a great threat to the design of future microelectronic systems with the continuation of the progressive downscaling of CMOS technologies. Hence increasing the robustness... View More

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