IEEE - Institute of Electrical and Electronics Engineers, Inc. - Analysis of The Test Data Volume Reduction Benefit of Modular SOC Testing

Design, Automation & Test in Europe. DATE'08

Author(s): O. Sinanoglu ; E.J. Marinissen
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 March 2008
Conference Location: Munich, Germany
Conference Date: 10 March 2008
Page(s): 182 - 187
ISBN (CD): 978-3-9810801-4-8
ISBN (Paper): 978-3-9810801-3-1
DOI: 10.1109/DATE.2008.4484683
Regular:

Modular SOC testing offers numerous benefits that include test power reduction, ease of timing closure, and test re-use among many others. While all these benefits have been emphasized by... View More

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