IEEE - Institute of Electrical and Electronics Engineers, Inc. - A General Method to Evaluate RF BIST Techniques Based on Non-parametric Density Estimation

Design, Automation & Test in Europe. DATE'08

Author(s): H.-G. Stratigopoulos ; J. Tongbong ; S. Mir
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 March 2008
Conference Location: Munich, Germany
Conference Date: 10 March 2008
Page(s): 68 - 73
ISBN (CD): 978-3-9810801-4-8
ISBN (Paper): 978-3-9810801-3-1
DOI: 10.1109/DATE.2008.4484662
Regular:

We present a general method to evaluate RF built- in self-test (BIST) techniques during the design stage. In particular, the adaptive kernel estimator is used to construct an estimate of the joint... View More

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