IEEE - Institute of Electrical and Electronics Engineers, Inc. - Power-Aware Testing and Test Strategies for Low Power Devices

Design, Automation & Test in Europe. DATE'08

Author(s): Dimitris Gizopoulos ; Kaushik Roy ; Patrick Girard ; Nicola Nicolici ; Xiaoqing Wen
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 March 2008
Conference Location: Munich, Germany
Conference Date: 10 March 2008
ISBN (CD): 978-3-9810801-4-8
ISBN (Paper): 978-3-9810801-3-1
DOI: 10.1109/DATE.2008.4484642
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