IEEE - Institute of Electrical and Electronics Engineers, Inc. - A Test Data Compression Method for System-on-a-Chip

2008 4th IEEE International Symposium on Electronic Design, Test and Applications (DELTA '08)

Author(s): Jianhua Feng ; Guoliang Li
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2008
Conference Location: Hong Kong, China
Conference Date: 23 January 2008
Page(s): 270 - 273
ISBN (Paper): 978-0-7695-3110-6
DOI: 10.1109/DELTA.2008.30
Regular:

This paper presents a novel and efficient code, named MFDR (modified frequency-directed run-length) , for test data compression. The proposed code is a class of variable-to-variable-length... View More

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