IEEE - Institute of Electrical and Electronics Engineers, Inc. - Improving Diagnosis Resolution without Physical Information

2008 4th IEEE International Symposium on Electronic Design, Test and Applications (DELTA '08)

Author(s): A. Rousset ; A. Bosio ; P. Girard ; C. Landrault ; S. Pravossoudovitch ; A. Virazel
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2008
Conference Location: Hong Kong, China
Conference Date: 23 January 2008
Page(s): 210 - 215
ISBN (Paper): 978-0-7695-3110-6
DOI: 10.1109/DELTA.2008.37
Regular:

This paper presents an extended version of a diagnosis method proposed so far, that considers only the logic information provided by the tester to achieve diagnosis results. The main advantage of... View More

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