IEEE - Institute of Electrical and Electronics Engineers, Inc. - Built-In Self-Test for Embedded Voltage Regulator

2008 4th IEEE International Symposium on Electronic Design, Test and Applications (DELTA '08)

Author(s): Jiang Shi ; R. Smith
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2008
Conference Location: Hong Kong, China
Conference Date: 23 January 2008
Page(s): 133 - 136
ISBN (Paper): 978-0-7695-3110-6
DOI: 10.1109/DELTA.2008.41
Regular:

The embedded voltage regulator design supports the single-chip CMOS integration market strategy to reduce the overall system cost and improve system performance. Multiply technologies, such as... View More

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