IEEE - Institute of Electrical and Electronics Engineers, Inc. - Crack Detection on Asphalt Surface Image Using Enhanced Grid Cell Analysis

2008 4th IEEE International Symposium on Electronic Design, Test and Applications (DELTA '08)

Author(s): S. Sorncharean ; S. Phiphobmongkol
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2008
Conference Location: Hong Kong, China
Conference Date: 23 January 2008
Page(s): 49 - 54
ISBN (Paper): 978-0-7695-3110-6
DOI: 10.1109/DELTA.2008.101
Regular:

This paper presents image processing techniques based on grid cell analysis for crack detection on non-uniform illumination and strong texture images. The techniques are grid cell analysis chain... View More

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