IEEE - Institute of Electrical and Electronics Engineers, Inc. - Total Power Minimization in Glitch-Free CMOS Circuits Considering Process Variation

2008 21st International Conference on VLSI Design

Author(s): Yuanlin Lu ; V.D. Agrawal
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2008
Conference Location: Hyderabad, India
Conference Date: 4 January 2008
Page(s): 527 - 532
ISBN (Paper): 0-7695-3083-4
ISSN (Paper): 1063-9667
DOI: 10.1109/VLSI.2008.29
Regular:

Compared to subthreshold leakage, dynamic power is normally much less sensitive to the process variation due to its approximately linear relation to the process parameters. However, the average... View More

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