IEEE - Institute of Electrical and Electronics Engineers, Inc. - On the Detection of Missing-Gate Faults in Reversible Circuits by a Universal Test Set

2008 21st International Conference on VLSI Design

Author(s): H. Rahaman ; D.K. Kole ; D.K. Das ; B.B. Bhattacharya
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2008
Conference Location: Hyderabad, India
Conference Date: 4 January 2008
Page(s): 163 - 168
ISBN (Paper): 0-7695-3083-4
ISSN (Paper): 1063-9667
DOI: 10.1109/VLSI.2008.106
Regular:

Logic synthesis with reversible circuits has received considerable interest in the light of advances recently made in quantum computation. Implementation of a reversible circuit is envisaged by... View More

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